Electron Microscopic Studies on Surface Fine Structures of Papers

Part.7. Studies on Filler and Pigment Informations of Paper Surfaces Obtained by Electron Probe Microanalysis

Abstract

To study filler and pigment distribution on paper surface, electron probe microanalysis was carried out by detecting and sorting of backscattered electron and characteristic X-ray generated at a specimen surface in the scanning electron microscope.
Both wavelength dispersive and energy dispersive spectrometer systems interfaced to the scanning electron microscope were introduced to this study.
(1) Backscattered electron image was proved to be effective to characterize filler distribution of uncoated paper.
(2) Elemental analysis of filler and pigment on paper surface was quickly achieved by energy dispersive spectrometer together with observation of surface topography.
(3) Distribution pattern of filler and pigment constituents was clearly shown by characteristic X-ray image which was obtained by means of wavelength dispersive spectrometer.