抄録
Fabrics have many features not found in the products of other industries in which sampling inspection is commonly practised. Considering these features of fabrics, the author suggests a new parameter by which to guarantee the quality of each individual fabric lot. The new parameter, R(%), shows the percentage of bad lots included in lots which pass inspection. The author applies it in the tightening and reducing of inspection.
If this parameter shows a high average percentage of defective fabrics, a whole lot should be inspected. If it shows only a moderate average percentage, sampling inspection will do.
In case of a low average percentage, it will do to pass a whole lot without inspection.
The author applies the new parameter to everyday inspection of fabrics. He has made chip-using experiments, which show that this new parameter is quite reasonable in theory as well as in practice. The author concludes that the new parameter is very useful for continuous sampling inspection.
