Reviews
Data-Driven Total-Scattering Measurements by Synchrotron X-rays
― Visualizing Heterogeneous Phenomena on the Atomic Scale ―
2020 Volume 40 Issue 159 Pages 33-36
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2020 Volume 40 Issue 159 Pages 33-36
Total-scattering measurements using high-brilliance synchrotron X-rays allow one to visualize heterogeneous phenomena inside a bulk on the atomic scale. However, such measurements have not been achieved yet because of noises caused by measurements and analysis. This paper reports a data-driven approach to correct X-ray response non-uniformity, which has been recognized as one of the problems in X-ray detectors.
