Abstract
Difference between two particle surfaces has been clearly obtained with Fourier-wavelet transform method even though the two particles are located in two dimensional different place. The method consists of three steps, the first is to acquire the difference between two particle surface image data in Fourier space. The second is to operate wavelet transform to the difference image data transformed with inverse Fourier. Finally, the decomposed data with each space-frequency level are acquired by inverse wavelet transform and its multiresolution analysis. The high frequency image shows location and size of the difference. This technique contributes to automation of particles classification.
