2000 Volume 20 Issue 2Supplement Pages 123-126
A fast and effective algorithm for particle detection is presented. In this method, correlation between a simple 1-dimensional function and image intensity is evaluated and binarized to detect particles. It is found that the calculation time of the present method takes less than 0.3 times of particle mask method, and the number of extracted particles by present method is about 1.5 times as that by standard binarization method.