Abstract
Thin films of magnesium fluoride were prepared by vacuum deposition on glass plates. Optical transmission, reflection and absorption of films were measured for the wavelength between 330mμ and 540mμ Refractive index was obtained from the observed value of wavelength which gives the extremum of reflection, and film-thickness measured by the multiple-beam interferometry technique. The refractive indices of evaporated films were found to be the same as that of bulk material. The extremum values of reflection, however, were not equal to the values suggested by interference theory
