The Reflection High Energy Electron Diffraction and X-ray Photoelectron Spectroscopy Studies of CeO2 Thin Films on Bi-based Superconducting Bulk Single Crystals

Yusuke GOTO; Hiroyuki TSUCHIDA; Heizo TOKUTAKA; Satoru KISHIDA; Kikuo FUJIMURA; Naohiko ITO

doi:10.3131/jvsj.37.183

Shinku

Online ISSN : 1880-9413
Print ISSN : 0559-8516
ISSN-L : 0559-8516

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The Reflection High Energy Electron Diffraction and X-ray Photoelectron Spectroscopy Studies of CeO₂ Thin Films on Bi-based Superconducting Bulk Single Crystals

Yusuke GOTO, Hiroyuki TSUCHIDA, Heizo TOKUTAKA, Satoru KISHIDA, Kikuo FUJIMURA, Naohiko ITO

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1994 Volume 37 Issue 3 Pages 183-186

DOI https://doi.org/10.3131/jvsj.37.183

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