Shinku
Online ISSN : 1880-9413
Print ISSN : 0559-8516
ISSN-L : 0559-8516
Elemental Relative Sensitivities in Sputtered Neutral Mass Spectrometry Using Electron-beam-excited Plasma
James W. BRADLEYShigeki KATO
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JOURNAL FREE ACCESS

1995 Volume 38 Issue 12 Pages 1020-1025

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Abstract
Usint experimental profiles for the radial beam-plasma parameters and electron impact ionization cross-section data, the neutral-to-ion conversion factors (NICF), α0M are determined for a selection of elements M in a new type of secondary-neutralmass-spectrometer called SNART (Sputtered Neutral Analysis Riken Type). Signal loss due to the curvature of the ion trajectories across the source magnetic field is taken into account. A comparison between the relative NICF's, α0M0Fe, and machine measured relative sensitivity factors D0M/ D0Fe is made. Results show the potential for quantitative analysis of insulating materials in SNART.
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© The Vacuum Society of Japan
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