2010 Volume 53 Issue 12 Pages 747-752
Neutron reflectivity is a feasible probe for surfaces and interfaces. It can provide information on the density, layer thickness and roughness for multilayered thin films. As it does not always require vacuum, one could study the variety of real surfaces and interfaces under the controlled atmosphere. The technique has some common features to X-ray reflectivity, but at the same time it owns very unique and extremely attractive features, such as high-sensitivity to low Z elements including isotope effects in soft materials and availability for magnetic structure analysis. The present article describes the recent activities of currently accessible neutron reflectometers in Japan.