Journal of the Vacuum Society of Japan
Online ISSN : 1882-4749
Print ISSN : 1882-2398
ISSN-L : 1882-2398
Review
Broadband Terahertz Spectroscopy and its Application to the Characterization of Thin Films
Ikufumi KATAYAMAMasaaki ASHIDA
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2010 Volume 53 Issue 5 Pages 301-308

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Abstract
  Recent progresses of the terahertz time-domain spectroscopy are reviewed in view of broadening the detection bandwidth that can be measured. Using an ultra-short pulsed laser with the pulse duration of 15 fs and photo-conducting antennas in the reflection geometry, we can realize useful broadband terahertz spectrometers that are capable of measuring real and imaginary parts of the dielectric constants in materials over a wide frequency range. The detection bandwidth expands up to 20 THz with the continuous phase information with only a small discontinuity around 8 THz. Even the higher frequencies up to 170 THz can be generated and detected using a 5-fs pulsed laser with on organic nonlinear crystal (DAST) and a photo-conducting antenna. These methods have a wide range of the applications and the several examples such as characterization of dielectric thin films and light-pump terahertz-probe spectroscopy are reviewed.
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© 2010 The Vacuum Society of Japan
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