Journal of the Vacuum Society of Japan
Online ISSN : 1882-4749
Print ISSN : 1882-2398
ISSN-L : 1882-2398
Letter
Deep Reactive Ion Etching of Lithium Niobate by Using Low-Frequency Bias
Toyohisa ASAJIHirofumi NABESAWAHidefumi UCHIYAMATakashi ABE
Author information
JOURNAL FREE ACCESS

2010 Volume 53 Issue 8 Pages 501-503

Details
Abstract
  Lithium niobate (LN) etching has been demonstrated with an electron cyclotron resonance (ECR) plasma and low-frequency bias. The etching was studied by using Ar, BCl3 and SF6 gases. The etch rates of BCl3 and SF6 are about 3.8 and 4.6 times higher than that of Ar, respectively. The highest etch rate (220 nm/min) was obtained under the condition of SF6 plasma and 1 MHz bias. The etching method which can fabricate micro-trenches with high-aspect ratio and smooth surfaces has been achieved.
Content from these authors
© 2010 The Vacuum Society of Japan
Previous article Next article
feedback
Top