Change of RHEED intensities as a function of surface H position on Ni(111)

Abstract

Based on the multiple scattering theory, RHEED intensities are calculated from H adsorbed on Ni(111) surfaces. The calculated intensities show systematic variations as a function of H position both in the surface normal and parallel directions under some diffraction conditions. RHEED intensities also change as a function of depth when H atoms exist in the subsurface region. The results show that RHEED intensity analysis can be used to extract the structural information of H atom on a surface, which was difficult in LEED and surface X-ray diffraction.