Radiation damage analysis of single-stranded DNA by total electron yield soft X-ray absorption spectroscopy

Abstract

We have previously confirmed that when a transistor using DNA is irradiated with soft X-rays, the drain current value decreased, which is thought to be due to DNA damage. In this study, for the purpose of investigating the radiation damage mechanism of DNA, we attempted to analyze the structural changes of single-stranded DNA using total electron yield soft X-ray absorption spectroscopy (TEY-XAS). The obtained spectra suggested the possibility of forming a pyrimidine dimer at the DNA base and elimination of the methyl group from thymine.