Nano-scale imaging of optical property of pentacene thin-film by photoinduced force microscopy

Abstract

Photo-induced force microscopy (PiFM) is based on atomic force microscopy (AFM) and is capable of observing optical properties of sample surfaces with nanoscale resolution. In this study, we used Photo-induced force microscopy to observe the optical properties of pentacene thin films at the nanoscale. As a result, we found that the photo-induced force of the second layer of pentacene film on the silver substrate is larger than that of the first layer.