Development of analysis method for thermoelectric performance of CNT thin films and its application to semiconductor purity and alignment dependence

Abstract

We have developed a method for analyzing the thermoelectric performance of carbon nanotube (CNT) thin films by combining a random stick network model with electrical and thermal network analysis. Using this method, we analyzed CNT thin films with different semiconducting purities and alignments. The results not only captured the characteristics of the experimental results well but also theoretically clarified the behavior of the Seebeck coefficient in the semiconductor purity dependence and the cause of the anisotropy of the electrical conductivity and the isotropy of the Seebeck coefficient in the films with controlled alignment.