Studies on energy-resolved distribution of electron trap as a macroscopic surface-structural analysis

Abstract

Allmost the all surface analytical methods are microscopic, and except for the elemental analysis by XPS, there are few macroscopic surface analysis methods such are zeta-potential measurement, impedance-analysis of electrodes or temperature-programmed desorption, which are all indirect and available to limited samples. Here, newly developed reversed double-beam photoacoustic spectroscopy enabling the measurement of energy-resolved distribution of electron traps for metal oxides is introduced.