Host: The Japan Society of Vacuum and Surface Science
We discussed the effect of probe's mass on the bending oscillation or length extension of the force sensor of the frequency-modulated atomic force microscope (FM-AFM). As the mass of the probe increased, the sensor’s frequency and dynamic spring constant were calculated to decrease in both bending oscillation and length extension, respectively. The reduction ratio is larger for length extension, and in the case of a force sensor that uses length extension such as a length-extension resonator (LER), it is necessary to obtain the atomic force using a model that takes into account the mass of the probe.
