Multi-atom resonance effect in X-ray fluorescence spectroscopy for solid surface

Abstract

Characteristic X-rays emitted from artificial mica (KMg₃AlSi₃O₁₀F₂) have been measured using synchrotron radiation as an excitation source. When the energy of the incident X-rays was tuned at the K 1s → 3p* resonance, it was found that the intensity of the Si Kα X-rays was enhance, but that of the Al Kα X-rays was constant. From these results, the intensity change is considered to be specific to the atoms that are located next to potassium. This phenomenon is expected to be applied to elucidate the species of the neighboring atoms of the target atom.