Feature Articles: Application and Future Aspect of Electron Microscopy in Industry
Applications of Transmission Electron Microscopy in Material Characterization of Ceramics
2009 Volume 44 Issue 1 Pages 7-10
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2009 Volume 44 Issue 1 Pages 7-10
TEM/STEM is a powerful tool in evaluation of ceramics materials due to its high spatial and temporal resolution. Performances of devices using ceramics materials are affected by its electric and chemical structure at nanometer scale. In this manuscript, we will describe applications of TEM/STEM for ferroelectric domain analysis, atomic characterization at grain boundary, and in-situ observations of sintering process of BaTiO3 ceramics.
