KENBIKYO
Online ISSN : 2434-2386
Print ISSN : 1349-0958
Lectures
Observation of Microstructures by Diffraction Contrast Technique
Kazuto Arakawa
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2011 Volume 46 Issue 4 Pages 258-265

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Abstract

TEM diffraction contrast technique is considerably useful for observation of microstructures in comparatively thick specimens to which high-resolution TEM/STEM is not applicable and grasp of the features of specimens over wide area. In this article, mechanism of the diffraction-contrast imaging of lattice defects and its applications are concisely presented.

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© 2011 The Japanese Society of Microscopy
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