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Development of 1.2 MV Atomic-Resolution Holography Electron Microscope
Takeshi KawasakiYoshio TakahashiTetsuya AkashiToshiaki TanigakiToshio OnaiKeigo KasuyaTadao FurutsuHiroyuki ShinadaNobuyuki Osakabe
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2016 Volume 51 Issue 2 Pages 122-126

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Abstract

We have developed an aberration-corrected 1.2MV atomic-resolution holography electron microscope. In a high resolution observation mode, a 43 pm linear information transfer was confirmed and 44 pm Ga-Ga dumbbells in GaN[411] thin sample were resolved. In a field-free observation mode, a 0.24 nm linear information transfer was confirmed and images of Au{111} lattices were observed.

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© 2016 The Japanese Society of Microscopy
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