2016 Volume 51 Issue 2 Pages 94-101
Scanning Electron Microscope (SEM) can show us various images reflecting not only the morphology but also their electrical character etc. We can choose the most suitable images among such various images according to the purpose. It is, however, necessary to clarify the origin or hindered physics beyond these images. We discuss the physics of scanning electron microscopy by clarifying the paradox of conflicting SEM images.