2025 Volume 60 Issue 1 Pages 9-13
To observe samples by transmission electron microscopy (TEM), it is necessary to irradiate them with a high-energy electron beam. This irradiation, however, causes significant damage to organic materials. To address this issue, low electron-dose imaging is essential for preserving the original structure of the samples. Under such low-dose conditions, the limited electron quantity results in noisy images, complicating structural analysis. Recently, advanced image analysis techniques using machine learning have emerged as promising tools for extracting signals from noisy images. This paper introduces a 3D tensor decomposition method to effectively remove noise from electron wave interference patterns (holograms) obtained under low-dose conditions. This approach facilitates the clear observation of the electric potential distribution in organic electroluminescence (EL) devices using 1/60 of the conventional electron dose. The technical approach and corresponding experimental results are discussed in detail.