Abstract
In this study, we attempt to identify parameters of a beam using an image processing method. The parameter identification is an inverse problem and easy to be influenced by noise. High accuracy of parameter identification requires a high measurement accuracy. Although the image processing method has attractive features, i.e., non contact method and high flexibility of setting, many researchers paid little attention to this method because of its low accuracy. We examined an approach that made up for the disadvantages of image sensing in order to carry out parameter identification.
