1:5希釈ガラスビードを用いた珪酸塩岩中の主成分および微量元素の蛍光Ｘ線分析

抄録

This report describes analytical techniques for major and trace elements in silicate rocks by X-ray fluorescence (XRF) spectrometry. The analyzed elements are SiO₂, TiO₂, Al₂O₃, total Fe₂O₃, MnO, MgO, CaO, Na₂O, K₂O, P₂O₅, Sc, V, Cr, Ni, Cu, Zn, Rb, Sr, Y, Zr, Nb, Ba, La, Ce, Nd and Pb. All of these elements were determined on a single glass bead made from mixtures of 1 g of sample powder, 5 g of Li₂B₄O₇ flux and about 50 mg of LiI releasing agent. A series of synthetic standard samples were prepared from pure chemical reagents to calibrate an XRF spectrometer. Matrix and line overlap corrections using a fundamental parameter approach yields reliable calibration lines with wide optimal ranges of composition. Analytical results of GSJ geochemical reference samples are in good agreement with their recommended values and exhibit sufficient precision and sensitivity for both major and trace elements.