光束密度追跡法とその応用
1980 年 9 巻 6 号 p. 342-347
詳細
1980 年 9 巻 6 号 p. 342-347
A process to calculate the illumination (the flux density along a ray path) over an arbitrary surface in an optical system is described. If the process is applied with Skew Ray Trace Algorithm, various kinds of calculation of illumination can be performed quantitatively and economically. As an example of calculation, the illumination of ghost is shown.
Also, a caustic surface is obtained by the locations where flux density becomes infinity. Here, the caustic surfaces of two sample lenses are shown, and the relationship between the caustic surfaces and ray aberrations is discussed.
