レーザー研究
Online ISSN : 1349-6603
Print ISSN : 0387-0200
ISSN-L : 0387-0200
レーザー解説
近接場赤外顕微分光・イメージング
河田 聡井上 康志
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ジャーナル フリー

2003 年 31 巻 12 号 p. 829-834

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抄録
Near-field optical microscopy provides us with super-resolving capability of optical and spectroscopic imaging/sensing by confining photons within a much smaller region than their wavelength. In this article, we review near-field infrared microscopy and spectroscopy for chemical analysis and imaging of materials at nanometric scale. After brief introduction to near-field optics, key elements for realization of near-field IR microscopy are described. Then, we show several experimental results of near-field IR spectroscopy using a several kinds of IR light sources and near-field probes. Possibility for application of FEL to near-field IR spectroscopy is also discussed.
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© 2003 一般社団法人 レーザー学会
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