The Review of Laser Engineering
Online ISSN : 1349-6603
Print ISSN : 0387-0200
ISSN-L : 0387-0200
Laser Original
A Practical System for Measuring Film Thickness by Means of Laser Interference with Laminar-Like Laser
Feng ZHUKazuhiko ISHIKAWAToru IBEKatsuhiko ASADAMasahiro UEDA
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2004 Volume 32 Issue 7 Pages 475-479

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Abstract
A practical system for measuring a film thickness based on laser interferometry has been constructed using a laminar-like laser and a CCD camera. The system can measure a film thickness at a measuring frequency of 50 Hz, which enables real-time measurement in practical use. The measurable minimum thickness by means of a blue laser having a wavelength of 405 nm was 2.4 μm, and the maximum thickness was 1.2 mm for a film with a refractive index of 1.4. The measurement error of the film thickness due to the spherical aberration of the cylindrical lens was Δh/h = 2% at maximum, where h expresses film thickness and Δh its error amount.
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© 2004 by The Laser Society of Japan
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