抄録
Embedding coded data to a target using micro-fabrication technology to hide secret data is one of the
most familiar techniques. However, there is a universal paradox that an attacker can also demonstrate
similar performance of the fabrication. In this paper, we propose nano-optical metrics, which is the
functional fusion of optical security and nanophotonics. Because nanophotonics have been defined as a
novel technology based on optical near-field interactions between light and material, they are difficult to
counterfeit. A basic procedure to retrieve nanoscale features of hidden data interactions is proposed
using nonscanning probe microscopy, and experimentally demonstrated through practical retrievals.
Furthermore, the definition of the feature quantities of retrieved results is shown and its applicability for
nano-optical metrics is experimentally demonstrated.
