抄録
Ptychography is an emerging scanning lensless microscopy that can simultaneously visualize both the
object function and the illumination field from multiple coherent diffraction patterns. In the X-ray region,
the fabrication accuracy of the lens is already approaching its technical limitation, and hence, ptychography
is regarded as a promising technique for the high-spatial-resolution imaging of bulk materials.
A combination of X-ray ptychography and X-ray absorption spectroscopy, called X-ray spectro-ptychography,
can also provide information on the chemical state and/or the atomic arrangement at the nanoscale
by reconstructing the spatially-resolved X-ray Absorption Fine Structure (XAFS) spectra. However, the
measurement of nanoscale XAFS is challenging due to its small absorption cross section, especially in
the hard X-ray region. Here, we introduce the basic principle of X-ray ptychography and report the recent
progress on the development and the application of hard X-ray spectro-ptychography.
