チャープした光コムを用いたワンショット3 次元計測手法による 超高速現象の計測

抄録

We developed a one-shot 3D measurement method using an optical frequency comb. High transverse spatial resolution was achieved by all-optical processing with precise phase control of the optical frequency comb. High speed, high accuracy, and wide dynamic range were achieved simultaneously. Such results have not been done by conventional methods. We also demonstrated 3D profile measurements with sub-μm uncertainty and a dynamic range over six digits. This method can also perform ultrafast 3D imaging with a single picosecond pulse. Using a 16-ps chirped pulse of an optical frequency comb, we demonstrated fully single-pulse 3D surface profile imaging with μm-level uncertainty and high image resolution with 100-square-pixels, determined by the resolution of the optics and the image sensors. Electric-field-induced picosecond transient 3D imaging was also demonstrated.