抄録
This paper discusses the reliability of 850- and 980-nm band VCSELs for automotive applications, based
on failure physics and reliability estimation methods that applied to edge-emitting semiconductor lasers
used in traditional optical fiber communication systems. The current VCSELs, which are fabricated using
matured crystal growth and process technology, are structurally stable and have better reliability at
high temperature operation than traditional edge-emitting type lasers. The current VCSELs are promising
optical sources for automotive applications.
