抄録
The X-ray optical system in the wavelength range 1-300Å has made great progress owing to the technological development to fabricate X-ray optical elements such as multilayer reflectors and Fresnel zone plates. We present the X-ray characteristics of reflectors and detectors used for the grazing and normal incidence imaging optical systems such as X-ray telescope and microscope. Multilayer reflectors are versatile X-ray optical elements in constructing an X-ray reflecting optical system. A charge coupled device (CCD) is a promising X-ray detector for a highly sensitive X-ray imager with the energy discriminating capability.
