Abstract
Multilayer reflectors play an important role in developing X-ray optical systems, such as X-ray telescope and microscpe in the wavelength region of 1-300A, where the normal incidence optics are no more applicable by making use of the total external reflection. The high reflectivity of multilayer reflectors in the limited wavelength band makes it possible to construct the normal incidence optical systems in the wavelength region of 30-300A. Moreover, their application to the reflecting surface of a grazing incidence mirror makes the reflectivity in the shorter wavelength region enhanced without squeezing the total reflection. We present here our recent progress in the fabrication of multilayer reflectors and their application to X-ray telescope and microscope.
