The Review of Laser Engineering
Online ISSN : 1349-6603
Print ISSN : 0387-0200
ISSN-L : 0387-0200
Preparation and Characterization of Sputtered Multilayers for Soft X-Ray Reflectors
Yoshikazu ISHIIHisataka TAKENAKA
Author information
JOURNAL FREE ACCESS

1990 Volume 18 Issue 11 Pages 904-909

Details
Abstract
Multilayers can be used as dispersion elements ndfocusing mirrors for soft x-ray. We develop new reflective optical elements utilizing themultilayer . Flat and curved large area multilayers are fabricated using our newly developed magnetron sputtering method. The multilayers are uniform in layer period within about ±1%. The reflectivity of the multilayers agrees well with theoretical calculations. The focusing properties of the curved multilayers are in agreement with ray-tracing calculations. An excellent reflectivity of 46% at l3nm wavelength is obtained. This reflectivity is sufficient for use as the focusing mirror for soft x-ray.
Content from these authors
© The Laser Society of Japan
Previous article Next article
feedback
Top