STMファミリーにおけるレーザーの利用
1991 年 19 巻 2 号 p. 147-158
詳細
1991 年 19 巻 2 号 p. 147-158
The present paper describes the applications of lasers to atomic force microscopy (AFM) and scanning tunneling microscopy (STM), placing emphasis on the following topics: (A) The basic theory of an optical interferometer and its applications to AFMs, AFMs using laser diode feedback, and an optical lever deflection detection systems. (B) A metrology STM, the generation of difference laser frequencies with STM.
