The Review of Laser Engineering
Online ISSN : 1349-6603
Print ISSN : 0387-0200
ISSN-L : 0387-0200
Measurement of Multi-photon Absorption and Electron Avalanche in UV Optical Thin Films
Hajime NISHIOKATakayuki KAWASUMIKen-ichi UEDAHiroshi TAKUMA
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1992 Volume 20 Issue 5 Pages 344-354

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Abstract

Non-linear absorption was measured for optical thin layers of various oxides and fluorides by using 1.7 ps and 20 ns pulses of a KrF laser. Laser induced damage due to two-photon absorp-tion was detected in oxide coatings by photo-acoustic measurement. In fluoride films, three photon absorption was less than linear absorption up to their damage threshold around 600GW/cm2. We measured photo-current in the films to detect dynamic absorption within nanosecond irradiation. A nonlinear current growth due to electron avalanche was observed. The damage thresholds were found to be correlated inversely with the carrier lifetime of coatings.

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