Journal of the Mass Spectrometry Society of Japan
Online ISSN : 1880-4225
Print ISSN : 1340-8097
ISSN-L : 1340-8097
報文
Doubly Differential Cross Sections for the Charge Exehange Process:
Part II. Experimental Studies on the Resolution of Time-of-Flight Analyzer and Proposal for the Focusing Analyzer
Naoki Nose
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ジャーナル フリー

1983 年 31 巻 3 号 p. 183-188

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抄録
A new time-of-flight analyzer is developed for the doubly differential cross section studies on charge exchange process. Experimental results for the limit of energy resolution revealed the incidental effects of the sweeping voltage. According to the time-depending ion optics, the incidental effect of sweeping field introduces the spreads in energy, direction, and length of the pulsed ion packet depending on the voltage as far as the slit widths are finite. An example for multi-focusing time-of-flight analyzer is proposed.
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© 1983 by The Mass Spectrometry Society of Japan
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