抄録
The author proposes a new approach to deriving the pattern coefficients of mass spectrometers in terms of such presumably measurable quantities as the partial ionization cross section and others. Firstly, the Intrinsic Pattern Coefficients that are inherent to an ion source are derived in terms of (l vs V) distribution of ionizing electrons and the partial ionization cross section of a sample gas. The (l vs V) distribution gives the transit path length of ionizing electrons as a function of the electron energy. Secondly, the amount of each fragment ion which is lost in the mass analyzing region is estimated. This approach was applied to three vacuum analyzers. The mutual differences in pattern coefficients that exist among them were successfully accounted for.
