Observation of Doubly Charged Tellurium Cluster Ions at Small Size Range Using a Secondary Ion Mass Spectrometry

Abstract

Mass spectra of doubly charged tellurium clusters were investigated by a secondary ion mass spectrometry. Cluster ions were produced by the Xe ions bombardment on the tellurium sheet and were mass-analyzed using a grand-scale sector type mass spectrometer. Te₂²⁺, Te₃²⁺, and Te₅²⁺ were observed.