Journal of the Mass Spectrometry Society of Japan
Online ISSN : 1880-4225
Print ISSN : 1340-8097
ISSN-L : 1340-8097
一般論文
DIOS法を利用した合成高分子の質量分析
―DIOSチップ作製の最適化―
奥野 昌二下前 幸康小原 一真藤原 博樹大山 淳大本 将義和田 芳直荒川 隆一
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2004 年 52 巻 3 号 p. 142-148

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抄録
Desorption/ionization on porous silicon (DIOS) is a novel matrix-free variant of laser desorption/ionization (LDI) techniques for mass spectrometry. The DIOS chips are produced by electrochemical etching of silicon wafers under light exposure. In the present report, the optimal conditions, regarding resistivity of silicon wafer, etching current density and etching time, for making DIOS chip with better ionization performance are described. In addition, the DIOS mass spectra of various synthetic polymers including polyethyleneglycol, nonylphenolpolyethoxylate, nonylphenolpolyethoxylatesulfate, polymethylmethacrylate are compared with the matrix-assisted LDI mass spectra.
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© 2004 日本質量分析学会
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