1977 Volume 25 Issue 4 Pages 379-383
Measurements were made by means of secondary ion emission mass spectrometry on weathered plagioclase in volcanic ash soils.Layers from the weathered surface to the fresh bulk were examined under a moderate condition peeling, where energies and intensities of peeling ions were carefully maintained as low as possible not to give the sample any disturbances except peeling. The results obtained on the layers from the top surafce to the bulk were in good agreement with those by scanning electron micro scopy(SEM)with respect to the surface and those by electron probe microanalysis (EPMA)with respect to the bulk. Some of the results were presented partly at the related meetings.