Materia Japan
Online ISSN : 1884-5843
Print ISSN : 1340-2625
ISSN-L : 1340-2625
Electrical Properties and Crystallographic Structures of Transition Metal/Silicon Interfaces
Shigeaki Zaima, Yukio Yasuda
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Keywords: silicon, metal /silicon interface, ohmic contact, silicide, Schottky barrier height, crystallographic structure
JOURNAL FREE ACCESS

1994 Volume 33 Issue 6 Pages 691-696

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