MATERIALS TRANSACTIONS
Online ISSN : 1347-5320
Print ISSN : 1345-9678
ISSN-L : 1345-9678
Phase Analysis of Multilayered, Nanostructured Titanium-Base Alloys by Analytical Electron Microscopy
Aleksandra Czyrska-FilemonowiczPhilippe A. Buffat
著者情報
ジャーナル フリー

2007 年 48 巻 5 号 p. 899-902

詳細
抄録

Microstructure, chemical and phase composition of the hard layer formed on the Ti-6Al-4V alloy after duplex surface treatment were investigated by light microscopy (LM), X-ray diffraction (XRD) and analytical scanning, transmission and scanning transmission electron microscopy (SEM, TEM, STEM), electron diffraction and focused ion beam (FIB). Advanced electron microscopy techniques used for unambiguous identification of phases present in the surface multilayer are critically discussed. The relationship between multilayer micro/nanostructure containing several phases from the Ni-Ti-P-Al system and improved mechanical and tribological properties is established.

著者関連情報
© 2007 The Japan Institute of Metals and Materials
前の記事 次の記事
feedback
Top