2016 年 57 巻 6 号 p. 789-795
Characterization of magnetic properties is one of the key issues for development of future magnetic and spintronic devices. The dimension and the operation frequency of those devices has reached nanoscale and GHz regime, respectively, so that it is required to realize new measurement technique with such sensitivity and time resolutions. The anomalous Hall effect (AHE) can be adopted as a probe capable to approach magnetization behavior in nanoscale structure. We have developed AHE measurement technique for nanostructure and investigated magnetization reversal behavior of perpendicularly magnetized dot in dynamic field. In this article, we overview the capability of AHE measurement as a probe for magnetic characterization and the experimental results of magnetization behavior of Co/Pt multilayer dots in pulse fields with nanoseconds durations.