Research on Grain Detection of Grain-Oriented Silicon Steel Based on Two-Dimensional X-Ray Diffraction

抄録

In order to improve the electromagnetic properties of transformer cores, grain size and boundaries detections of grain-oriented silicon steel are necessary. Conventional electron microscopic grain size detection is off-line and destructive, which cannot meet the requirements of modern production. X-ray detection is non-destructive and the sample can be dynamic. In this paper a new method of the grain boundaries detection of the Hi-B grain-oriented silicon steel with large grains has been proposed based on the change of images capturing by the two-dimensional X-ray diffraction system. The grain boundaries map is calculated with diffraction information which is extracted from the images based on a series of image processing algorithms. The results are basically consistent with the electron microscopy. Compared with the traditional method, the dynamic and non-destructive detection method is able to increase the detection efficiency and improve the overgeneralization of sampling. Compared with X-ray diffraction contrast tomography, this method is more efficient and low-cost. The sample can also be used after the detection, especially in high-end applications. When the grain boundaries are determined, the necessary processing method can be adopted to further enhance its electromagnetic performance in subsequent processing.