Transactions of the Japan Institute of Metals
Online ISSN : 2432-4701
Print ISSN : 0021-4434
ISSN-L : 0021-4434
125 kV Field Emission Electron Microscope and Its Application to Lattice Imaging
Akira TonomuraTsuyoshi MatsudaJunji EndoNobuyuki Osakabe
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1983 Volume 24 Issue 6 Pages 470-472

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Abstract
An electron microscope with a 125 kV field emission electron gun has been developed. This gun provides a more monochromatic and collimated electron beam than a conventional one, which can reduce the effect of the chromatic abberations in the objective lens, especially, on lattice images. Examples are shown to illustrate distinct features of the field emission electron beam.
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