抄録
The microstructure and the crystallographic coherency of chromium films plated on copper substrates have been investigated by transmission electron diffraction and microscopy. The orientation relation ships between the deposited chromium film and the copper substrate are
(110)Cr//(001)Cu, [112]Cr//[1\bar10]Cu
or [112]Cr//[110]Cu.
When the crystals have the relationship of [112]Cr//[1\bar10]Cu, the difference between the lattice spacings of (112)Cr plane and (1\bar10)Cu plane is −8.54%. The arrangement of chromium atoms and copper atoms along this direction is not in good condition to fit each other. The misfit strain exists in the interface between the deposited chromium film and the substrate. In transmission electron micrographs of chromium film with this relationship, many microtwin crystals are observed along the [110]Cu and [1\bar10]Cu directions. It has been shown that these microtwin crystals are misfit twins and contribute to relief of the large misfit strain.
