1995 Volume 36 Issue 5 Pages 686-688
By using the imaging plate, electron diffraction patterns of an Au thin film were observed quantitatively by changing the temperature. Intensity of both Bragg reflections and the background in the electron diffraction patterns contributed from thermal diffuse scattering as well as plasmon scattering were measured accurately. It was shown that the background contributed from the thermal diffuse scattering in the electron diffraction patterns increased monotonously with the increase of temperature. The change in the observed intensity of the thermal diffuse scattering with the change in temperature was briefly discussed in terms of a theoretical model.
