Proceedings of Microelectronics Symposium
Online ISSN : 2434-396X
MES2009
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Host: Japan Institute of Electronics Packaging

MES2009
Ray-tracing Simulation of optical characteristics of three types of phosphor structures excited by near-UVLED
*[in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese]
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Pages 2B3-2-

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© 2009 The Japan Institute of Electronics Packaging
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